Abstract：In order to automatically inspect chip components with the placement
machine vision system, an algorithm based on connected region
labeling is proposed to extract the features of chip components.
Firstly, an image preprocessing method is defined to improve the
quality of the lead part. On the basis of image preprocessing, in
order to extract the overall and geometric features of a chip
component, morphological connected region labeling and boundary
extraction methods are adopted. In the feature extraction process,
the inspection of chip component type is completed by using the
extracted features sequentially. The experimental results show that
the proposed algorithm can inspect various types of chip components
with good accuracy.
Zujin Wang;Xiaodiao Huang;Pingping Gu. An Inspection Algorithm of Chip Component Type Based on Connected Region Labeling[J]. , 2014, 11(11): 3883-3892.
Zujin Wang;Xiaodiao Huang;Pingping Gu. An Inspection Algorithm of Chip Component Type Based on Connected Region Labeling. , 2014, 11(11): 3883-3892.
2014, Vol. 11 
